22/12/2025
Three days, countless conversations, and one shared goal: moving semiconductor innovation forward.
Our booth at Semicon Japan was buzzing with visitors; customers, partners, and curious minds eager to explore what’s next in metrology.
We loved the energy, the questions, and the chance to exchange ideas face-to-face.
One of the highlights was the STS Metrology/Inspection session, where Koichi Wakamoto, Director of Applications, at Nova Japan, delivered a deep dive into the challenges and solutions in materials metrology for advanced logic architectures.
As devices scale below 2nm, metrology must rise to meet atomic-level demands, and it’s clear the path from lab to fab depends on innovation, precision, and collaboration.
Thank you to everyone who joined us, let’s keep building the future together.