17/10/2016
Hitachi S-3000N SEM Scanning Electron Microscope
مجدد
Hitachi S-3000N SEM Scanning Electron Microscope
Secondary electron resolution: 3.5nm to 50nm (sample dependent)
Backscatter electron resolution: 5.5nm to 100nm (sample dependent)
Magnification: 15 to 100,000x
Filament: Tungsten filament
Accelerating voltage: 0.3 to 30 kV
Equipment Usage
Warranty: 90 Days
السعر 45.000 الف دولار